美国ILT2400辐照计配合XSD340AT7探头可用于测量320~475nm波段、中心波长405nm的辐照度,量程8e-6至60W/cm2,可用于高强度曝光机UV固化工艺测量,以及光阻剂测量、3D打印等监测应用。关于美国International Light XSD340AT7 紫外辐照计详细产品介绍请点击图片或网址http://www.testeb.com/XSD340AT7.html
美国International Light XSD340AT7 紫外辐照计
美国International Light XSD340AT7 紫外辐照计规格说明文档下载链接地址http://www.testeb.com/download/201805/ILT2400_XSD340AT7.pdf。(注)点击链接可直接阅读文档,或右键选择“另存为”保存到电脑。
SED005-UVF-A313说明书:http://www.testeb.com/download/201806/ILT2400_UVLED_SED005UVF.pdf
XSD340A说明书:http://www.testeb.com/download/201805/ILT2400_Quick_Manual.pdf
SED254QT说明书:http://www.testeb.com/download/201805/ILT2400_SED254-QT.pdf
UVA说明书:http://www.testeb.com/download/201601/UV-A_manual.pdf
XSD140B说明书:http://www.testeb.com/download/201805/ILT2400_XSD140B.pdf